Semiconductor Parameter Analyzer

Agilent 4155B/4156B is an electronic instrument for measuring and analyzing the characteristics of semiconductor devices. This one instrument allows you to perform both measurement and analysis of measurement results.Features：High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1 µV to 200 VFully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUsSynchronized stress/measure function, two high-voltage pulse generator units (±40 V)Time-domain measurement: 60 µS variable intervals, up to 10,001 pointsEasy to use: knob-sweep similar to curve tracer, automatic analysis functionsAutomation: built-in HP Instrument BASIC, trigger I/O capability