High Speed Source Monitor Unit

The Keysight E5262A Source Monitor Unit provides a high-speed parametric test solution for semiconductor, RFIC, and optical component testing needs. Key features include a high-speed DC measurement of current and voltage, enhanced measurement speed for fast throughput, expanded program memory, 16 digital I/O lines for sophisticated triggering requirements, and parallel test capability.With the Keysight E5262A (Agilent) Source Monitor all trigger signals are processed via hardware rather than firmware providing the fastest possible trigger response from the instrument. The front panel control of the Agilent E5262A Source Monitor allows convenient performance and reporting of spot measurements via a simple front-panel interface, without programming as well as the ability to view other items of interest, such as error messages, valuable when debugging the instrument performance under automated control.Features and Specifications of the Keysight E5262A (Agilent) Monitor include:Features:Available Slots: Two channel (2x MPSMU) configurationGround Unit (GNDU) Sink Capability: 2.2 AInstrument Control: GPIBExternal Trigger Inputs/Outputs: 1 BNC Trigger In; 1 BNC Trigger Out; 8 Programmable Trigger In/OutHigh Speed MPSMU Measurement Capabilities: Maximum Force Voltage: ± 100 VMaximum Force Current: ± 200 mAVoltage Measurement Resolution: 100 µVCurrent Measurement Resolution: 5 pA